2024
11-01
After white light interference technolog...
Optical Frequency Comb (OFC) refers to a spectrum composed of a series of uniformly spaced frequency components with coherent and stable phase relationships on the spectrum. It is usually generated by a mode-locked laser, where each comb re...
2024
10-30
The poor flatness of the bonding surface...
The grinding methods for reducing wafer TTV (Total Thickness Variation) mainly include the following:1、 Adopting advanced grinding technologySilicon wafer rotary grinding:Principle: The monocrystalline silicon wafer and cup-shaped diamond g...
2024
09-21
What are the preparation methods for sin...
The preparation method of single-sided indium phosphide chips mainly includes the following steps:1、 Basic preparation processGrinding: Use grinding solution to grind InP (indium phosphide) chips. Grinding fluid usually contains water, Al2O...
2024
08-18
Vertical focusing detection
What is vertical focusing detection?Vertical focus detection (VFP) is based on the use of partial light cones. Individual light rays diffusely reflected from vertical surfaces are captured by the lens. Sidewings exceeding 90 ° can be measur...
2024
08-18
Surface parameters
Many times, the mechanical design of workpieces includes specifications that define parameters such as surface roughness or ripples. The Polytec TopMap surface measurement method based on white light interference principle can obtain the en...
2024
08-18
Compare ellipsometer and spectral reflec...
Spectral ellipsometer (SE) and spectral reflectometer (SR) both use the analysis of reflected light to determine the thickness and refractive index of dielectric, semiconductor, and metal thin films. The main difference between the two is t...