400 6550 650

EN

/

CN

Register

|

Login

  • |

Guangzhou Wanzhi Optical Technology Co., Ltd

  • HOME
  • MEASUREMENT
  • PRODUCT
  • TECHNICAL
  • NEWS
  • SERVICE
  • ABOUT US
  • CONTACT US
  • HOME
  • MEASUREMENT
  • PRODUCT
  • TECHNICAL
  • NEWS
  • SERVICE
  • ABOUT US
  • CONTACT US
  • |

400-8833-856

CN

/

EN

Optical microscopy 3D measurement
Optical microscopy 3D measurement
Step groove (Microscopic)
Surface Defect(Microscopic)
Warping/Straightness (Microscopic)
Surface roughness (Microscopic)
Step/groove (Macroscopic)
Angle/Radian(Macroscopic)
Flatness/Parallelism(Macroscopic)
Wafer TTV/BOW/WARPAGE(Macroscopic)
Non standard customized in-depth development
Non standard customized in-depth development
Real time monitoring of laser welding
Long distance thinning thickness monitor
High precision positioning of wafer coupling
Fusion of 2D/3D defect discrimination
3D Rotating Scanning of bore inner wall
Roundness and cylindricity runout
Large stroke sample measurement
Long distance 3D contour measurement
Microscopic dynamic 3D vibration testing
Microscopic dynamic 3D vibration testing
MEMS microphone
MEMS pressure sensing
MEMS cantilever
MEMS dynamic 3D amplitude
CMUT
MEMS comb shaped drive
MEMS comb shaped drive
MENS
Macro dynamic 3D vibration testing
Macro dynamic 3D vibration testing
Ultrasonic welding electrode
Bicycle bracket
Acoustical vibration
Turbine blade vibration
Automotive NVH
Drone wing vibration
Traffic speed measurement
Speed sensor
Optical microscopy 3D measurement
Optical microscopy 3D measurement
3D White Light Interference Imaging System
3D Spectral Confocal Imaging System
Wafer Thickness Mapping System
3D laser frequency comb imaging system
Non standard customized in-depth development
Non standard customized in-depth development
Real time monitoring of laser welding
Long distance thinning thickness monitor
High precision positioning of wafer coupling
Fusion of 2D/3D defect discrimination
3D Rotating Scanning of bore inner wall
Roundness and cylindricity runout
Large stroke sample measurement
Long distance 3D contour measurement
Microscopic dynamic 3D vibration testing
Microscopic dynamic 3D vibration testing
Microscopic laser vibrometer
Macro dynamic 3D vibration testing
Macro dynamic 3D vibration testing
Full field scanning laser vibrometer
Robot vibration measurement station
Single point laser vibrometer
Contact Us
Join Us
HOMETECHNICALMeasuring Principle
  • Measurement Plan
  • Measuring Principle
  • Indicator Concept
  • Process Scheme
2024
12-11
Principle of Heterodyne Laser Interferen...
1、 Basic principlesHeterodyne laser interferometers typically consist of two coherent lasers, referred to as signal light and reference light, respectively. These two laser beams are split into two beams by a beam splitter, with one beam pa...
2024
11-12
The 3D imaging principle of the panorami...
1、 Basic principlesSuper depth microscope uses laser beams for three-dimensional imaging. It achieves three-dimensional imaging by using devices such as interference fringe microscopy and phase-shifting interference microscopy, combined wit...
2024
11-10
The Development and Evolution of OCT Opt...
1、 Origin and Basic Principles of TechnologyOCT (Optical Coherence Tomography) optical coherence tomography technology was first proposed by Chinese American scientists David Huang and others at the Massachusetts Institute of Technology in ...
2024
11-08
The technological evolution process of w...
1、 Initial application stageIn the 1950s and 1960s, some application type white light interferometers emerged both domestically and internationally. These interferometers mainly rely on manual operation, reading, calculation, and measuremen...
2024
11-07
Working principle and advantages and dis...
1、 Working principleThe blue light 3D scanner utilizes blue light projection heterodyne multi frequency phase shift technology for 3D scanning measurement. Specifically, it first projects blue light grating fringes onto the object being mea...
2024
11-06
The working principle and advantages and...
Moir é fringes are an optical phenomenon first discovered by French researcher Moir é in the 18th century. Technically speaking, Moir é fringes are the visual result of interference between two lines or objects at a constant angle and frequ...
  • Home
  • Previous
  • Next
  • Last
  • Page1/3
  • All 14 record
  • 页6 record
  • Turn toGO
  • 共3页
  • 首页
  • Previous
  • 1
  • 2
  • 3
  • Next
  • 尾页
How should I address you?
1/2 Complete
Name
Company Name
Mobile
Mobile

Privacy Statement

400 6550 650

1001, No.119 Chuangqiang Road, Zengcheng District, Guangzhou, Guangdong, China

www.onez-opti.com

vitoxie@onez-opti.com

For more exciting content, welcome to follow ONEZ Optical Self Media.

Product Consultation
Test
Testing services
Contact Us
Link
Baidu
Tencent Video
Alibaba
China Mobile
China Telecom
China Unicom
Alibaba Cloud
Tencent Cloud
Copyright ©2024 ONEZ
Sitemap
粤ICP备2024292578号
粤公网安备44011802000919
  • 微信

  • 电话

    400 6550 650
微信电话
  • 微信

Click on the phone to make a call
  • 400 6550 650