The 3D imaging principle of the panoramic microscope

Date:

2024-11-12

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1、 Basic principles


Super depth microscope uses laser beams for three-dimensional imaging. It achieves three-dimensional imaging by using devices such as interference fringe microscopy and phase-shifting interference microscopy, combined with computer control. These devices are capable of controlling the amplitude and wavelength of the laser beam and capturing interference phenomena generated by the sample.


2、 Specific imaging process


Laser beam irradiation:


Super depth microscopes typically consist of two or three laser beams. Among them, one laser serves as the light source, while the other or two laser beams interfere with the sample.


The laser beam is irradiated onto the sample and produces different interference phenomena at different depths.


Interference phenomenon capture:


The laser beam reflected by the sample intersects with the directly irradiated laser beam on the detector, forming an interference pattern.


The interference pattern contains the distribution and morphological information of the sample at different depths.


Phase modulation and detection:


In practical operation, in order to control the amplitude and wavelength of the laser beam, a phase-shifting interference microscope is also required to be used in conjunction with a super depth of field microscope.


Phase shift interference microscopy changes the phase of the laser beam by altering the position or tilt angle of the reflecting mirror, thereby achieving more accurate three-dimensional imaging.


Image generation and processing:


The interference pattern is captured by the detector and converted into an electrical signal.


The computer receives these electrical signals and converts them into three-dimensional images through image processing algorithms such as multi focal plane overlay and depth map generation.


These algorithms can utilize image information from different focal planes to superimpose and fuse into a panoramic 3D image with high depth of field.


3、 Technical features


Large depth of field: Super depth of field microscopy can capture detailed information from the surface of the sample to deep structures, achieving large depth of field imaging.


High resolution: By precisely controlling the laser beam and interference phenomena, the super depth of field microscope can provide high-resolution images.


Clear imaging: Advanced image processing algorithms and phase modulation techniques ensure clear and accurate images.


Real time dynamic observation: The super depth of field microscope can continuously observe the changes of the sample at different time points, which is helpful for studying the dynamic process and reaction of the sample.


4、 Application Fields


Super depth of field microscopy has a wide range of applications in various fields, including intelligent manufacturing, material analysis, semiconductors, new energy, automobiles, electronic transmission, medical pharmaceuticals, aerospace, and agriculture, forestry, and geology. It can observe samples from different depths, directions, and positions, providing a broader perspective and more accurate data for scientific research.


In summary, the 3D imaging principle of the super depth of field microscope is based on the principle of light interference and combined with advanced computer image processing technology. It provides high-resolution, large depth of field, and clear imaging effects by precisely controlling the laser beam and interference phenomena, and using image processing algorithms to convert the interference pattern into a three-dimensional image.