Better than 1nm resolution, easy to measure silicon wafer surface roughness measurement, Ra=0.7nm
Better than 1nm resolution, easy to measure silicon wafer surface roughness measurement, Ra=0.7nm
Millimeter level field of view, achieving 5nm organic oil film thickness scanning
Millimeter level field of view, achieving 5nm organic oil film thickness scanning
Nano level accuracy, achieving micrometer level depth and width measurement
Nano level accuracy, achieving micrometer level depth and width measurement
Auto focus, auto leveling, one click generation of statistical reports
Auto focus, auto leveling, one click generation of statistical reports
Newly equipped with ECT anti-interference system, compatible with automated measurement of production lines
Newly equipped with ECT anti-interference system, compatible with automated measurement of production lines
New human-computer interaction software design, fully improving the convenience of use
New human-computer interaction software design, fully improving the convenience of use

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3D White Light Interference lmaging System

3D White Light Interference lmaging System

3D White Light Interference lmaging System
中英文目录下载
3D White Light Interference lmaging System

Please refer to the product catalog for details

接触并了解在您生产线和生产过程中使用FocalSpec线共焦传感器的优势。


开始解决最具挑战性的扫描，测量和检测应用一从曲面玻璃到多层透明材料到高反光金属表面。FocalSpec线共焦传感器是最适合您的视觉解决方案。

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